10

Improvement in very thin gate oxide integrity by ion implantation

Year:
1983
Language:
english
File:
PDF, 192 KB
english, 1983
19

Thickness and field dependence of defects in silicon dioxide

Year:
1978
Language:
english
File:
PDF, 497 KB
english, 1978
26

Reduced hot-electron effects in MOSFET's with an optimized LDD Structure

Year:
1984
Language:
english
File:
PDF, 254 KB
english, 1984
29

Comments on "Source-and-drain series resistance of LDD MOSFET's"

Year:
1984
Language:
english
File:
PDF, 292 KB
english, 1984
31

Inversion layer transport and properties of oxides on InAs

Year:
1980
Language:
english
File:
PDF, 1.01 MB
english, 1980
39

Can Equipment Failure Modes Support the Use of a Condition Based Maintenance Strategy?

Year:
2014
Language:
english
File:
PDF, 325 KB
english, 2014
44

Battery ripple effects in cascaded and parallel connected converters

Year:
2015
Language:
english
File:
PDF, 948 KB
english, 2015